History
Omniprobe was founded in 1999 in Dallas, Texas to design and manufacture analytical tools and accessories, primarily for the semi-conductor industry. The founder and initial employees were formerly from the Materials Characterization Group at Texas Instruments Central Research Labs. The first product offering was a chamber-mounted precision nanomanipulator for the FIB which enabled Omniprobe's patented "Total Release" method for in-situ lift-out, as well as innovative nano-mechanical and electrical testing.
Omniprobe has been, from its inception, a group of expert users and former customers of failure analysis and materials characterization tools. Today, our product offering continues to expand. Omniprobe now offers the first system for totally automated and "hands free" in-situ lift-out in the dual beam FIB. Omniprobe provides the first automated multi-gas injection system for the FIB/SEM with feedback control, the revolutionary Short-CutT system that cuts sample preparation time in half, a sample transfer system for air-sensitive TEM samples that are made in the FIB, as well as other new products now in the pipeline.
With over 350 systems in the field, our customer list is a "who's who" of the semi-conductor manufacturing industry, many of whom own multiple Omniprobe systems. Our company has been guided by the principle of "time saving tools designed by expert users" and has maintained a close bond between the customer and the product design team. This value and practicality can be seen in each of our products, accessories and consumables. We enjoy our customer relationships and can accommodate custom solutions. We have established a reputation for spoiling our customers with support after the sale.
Please contact me with any questions about our technology or your specific needs.
Tom Moore, President