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Recent Patents List

1. 6,420,722 July 16, 2002
Method for sample separation and lift-out with one cut
Moore; Thomas M. (Dallas, TX), Kruger; R. D. (Dallas, TX), Hartfield; Cheryl (Dallas, TX)

2. 6,570,170 May 27, 2003
Total release method for sample extraction from a charged-particle instrument
Moore; Thomas M. (Dallas, TX)

3. 6,777,674 August 17, 2004
Method for manipulating microscopic particles and analyzing
Moore; Thomas M. (Dallas, TX), Anthony; John M. (Austin, TX)

4. 6,841,788 Jan. 11, 2005
Transmission electron microscope sample preparation
Robinson; Joseph (Portland, OR), Church; Kenneth H. (Stillwater, OK)

5. 6,927,400 Aug. 9, 2005
Sample manipulation system
Rasmussen; Jorgen (Beaverton, OR)

6. 6,982,429 Jan. 3, 2006
Transmission electron microscope sample preparation
Robinson; Joseph (Hillsboro, OR), Church; Kenneth H. (Stillwater, OK)

7. 6,995,380 Feb. 7, 2006
End effector for supporting a microsample
Rasmussen; Jorgen (Beaverton, OR)

8. 7,053,383 May 30, 2006
Method and apparatus for rapid sample preparation in a focused ion beam microscope
Moore; Thomas M. (Dallas, TX)

9. 7,115,882 October 3, 2006
TEM sample holder
Moore; Thomas M. (Dallas, TX)

10. 7,126,132 October 24, 2006
Apparatus for preparing a TEM sample holder
Moore; Thomas M. (Dallas, TX)

11. 7,126,133 October 24, 2006
Kit for preparing a tem sample holder
Moore; Thomas M. (Dallas, TX)

12. 7,208,724 April 24, 2007
Apparatus and method of detecting probe tip contact with a surface
Moore; Thomas (Dallas, TX), Zaykova-Feldman; Lyudmila (Dallas, TX)