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Systems

AutoProbe™ 200
Omniprobe's fully automated, multi-purpose, nano-manipulator capable of in-situ lift-out, electrical measurements, nano-mechanical testing, MEMS assembly, and charge neutralization in the FIB, Auger, or SEM.

AutoProbe™ 300
Based on the AutoProbe™ 200, the AutoProbe™ 300 offers the same versatility as the 200 with the added benefits of in-situ probe tip exchange and high throughput TEM sample prep using the external ShortCut™ system.

Short-Cut™
Omniprobe’s Short-Cut™ tool offers an innovative solution for high-throughput TEM sample preparation. It is an integral part of Omniprobe’s AutoProbe™ 300 in-situ lift-out system. The Short-Cut™ system effectively bypasses the need for the in-situ grid attach step during lift-out, and optimizes FIB resources in a high-volume process control application.

OmniGIS™
Omniprobe's multiple gas injection system for the FIB or SEM provides programmable feedback control of three on-board gas sources and an additional external purge/carrier gas source while occupying only a single GIS port.

Sensitive Sample Transfer (SST)
An integrated system used to transfer environmentally sensitive samples from the FIB to any other analytical instrument.